Automatic Defect Classification (Special ed. for TI). ISOA, TTU. February 13-14, 1995
- Containers:
- Box 61, Folder 7
- Identifier:
- Archival Resource Key
- Scope and content:
-
This document describes an approach that allows a semiconductor production unit to incorporate expert knowledge into automates inspection facilities, to use its own terminology and criteria, and to monitor levels of relevant defects.
- Language:
- English .
Access and use
- Parent restrictions:
-
Open for research except for restricted and born-digital materials and series 4 (restricted materials) which is closed until 1 January 2050
Born-digital materials are closed until processed. Please fill in form to express interest in this collection: https://docs.google.com/forms/d/e/1FAIpQLScbfivP_5HCLVGCFQjPa3Qq_D2L2SzIuQyxB5Ak0IDM8eQ1Yg/viewform
Audiovisual materials are not available in their original format and must be reformatted to digital copies.
- Parent terms of access:
- While Special Collections is the owner of the physical and digital items, permission to examine collection materials is not an authorization to publish. These materials are made available for use in research, teaching, and private study. Any transmission or reproduction beyond that allowed by fair use requires permission from the owners of rights, heir(s) or assigns.
- Location of this collection:
-
Department of Special Collections, Green Library557 Escondido MallStanford, CA 94305-6004, US
- Contact:
- (650) 725-1022