Title:
Microscope QA Inspection, 1970
Creator:
Intel Corporation
Subject:
Electronic industries; Manufacturing; Microscopes; People; Photographs; Quality
assurance; Santa Clara (Calif.); Santa Clara County (Calif.)--History; Semiconductor
wafers; Technicians; Technology; Women;
Description:
Black-and-white photograph of quality assurance inspection operator using a
microscope to examine 2-inch wafers for production flaws.
Publisher:
Intel Museum Archives
Contributor:
Historical Manufacturing
Date:
1970 1970
Type:
Photograph
Format:
20 x 25 cm.
Identifier:
cstcli 1998.3032 - 260766
Source:
lcsh, local, tgm I
Language:
eng
Relation:
Silicon Valley History Online
Coverage:
ark:/13030/kt0779p9vd
Rights:
Copyright ©Intel Corporation 1970. All Rights Reserved. Transmission and
reproduction of a single copy of this work for non-commercial use in research or
teaching in the United States is permitted if Intel is credited as the source of the
work. The work must remain intact, as a complete whole and may not be combined with any
other image or work to create a new document. Copyright ©Intel Corporation 1970. All
Rights Reserved. Transmission and reproduction of a single copy of this work for
non-commercial use in research or teaching in the United States is permitted if Intel is
credited as the source of the work. The work must remain intact, as a complete whole and
may not be combined with any other image or work to create a new document.