Terman's papers include correspondence and data for his study of the gifted; professional correspondence with colleagues;
and correspondence and data on tests and testing: Army Alpha and Beta tests, Stanford revision of the Binet-Simon Intelligence
scale, Stanford Achievement Test, Terman McNemar Test of Mental Ability, Terman Group Test, Attitude-Interest Analysis Tests,
and Male Female Tests.
Lewis Madison Terman was born in Johnson County, Indiana, on January 15, 1877. He received his A.B. and A. M. from Indiana
University and his Ph.D. from Clark University. He came to Stanford in 1910 to teach in the Department of Education; from
1910 to 1916 he worked on constructing an American version of Binet's intelligence test, which he reported in
The Measure of Intelligence (Houghton, Mifflin, 1916).
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